AFM (Atomic-Force Microscopy)

Microstructure characterisation
Yes
30
No
No
n/a
NT-MDT

SOLVER PRO, NT-MDT. It is a scanning probe microscope  dedicated to surface microtopography analysis. This technique is especially useful for imaging residual scratches, indentations or other nanoscale surface features as well as accurately measuring their dimensions. After the tests AFM data of coatings and thin films can be vieved as 2D and 3D images or depth profiles; the surfaces can be characterized in terms Ra, Rz and other parameters.


This equipment is used by

Tekniker

Spain